高速光計測装置

OCI -V Optical Vector Analysis System

OCI-V is a cutting-edge optical vector analysis system engineered for high-speed, comprehensive parameter measurements in optical device testing. It employs coherent detection techniques to ensure precise evaluations of parameters such as insertion loss, chromatic delay, polarization mode dispersion, polarization dependent loss, and the Jones matrix. With its unique optical path design and advanced algorithms for intelligent calibration, OCI-V offers reliable accuracy and simplified operations that significantly reduce testing time for researchers and engineers in optical communications and silicon photonics.

APPLICATIONS

• Optical Device Testing and Analysis 

• Loss, Dispersion, and Polarization Measurement 

• Research and Development in Optical Communication and Silicon Photonics

Main Parameter
Wavelength	C+L band: 1525 nm~1625 nm; O band: 1265 nm ~1340 nm
Measurement length	200m
Wavelength accuracy	±1.0 pm
Wavelength resolution	1.6 pm
Insertion Loss	Standard	Dynamic
Dynamic range	60 dB	80 dB
Insertion loss accuracy	±0.1 dB	±0.05 dB
Resolution	±0.05 dB	±0.002 dB
Polarization Dependent Loss
Dynamic rang	40 dB	50 dB
Accuracy	±0.05 dB	±0.03 dB
Chromatic
Accuracy	±10 ps/nm	±5 ps/nm
Group Delay
Range	6 ns
Accuracy	±0.2 ps	±0.1ps
Loss range	45 dB	60 dB
Polarization Mode Dispersion
Range	6 ns
Accuracy	±0.1 ps
Loss range	40 dB	50 dB