OCI High-resolution Optical Link Diagnostic System
The OCI High-Resolution Optical Link Diagnostic Instrument harnesses OFDR technology to deliver precise diagnostics for silicon photonics. It quickly identifies issues like macro-bends, connection points, and breakpoints, and accurately measures parameters including return and insertion loss, and spectral characteristics. With event point positioning as precise as 0.1mm, OCI also supports distributed optical fiber sensing for high-resolution strain and temperature measurements.
APPLICATIONS
Optical Device Testing and Analysis
Loss, Dispersion, and Polarization Measurement
Research and Development in Optical Communication and Silicon Photonics
| Main Parameter | |
|---|---|
| Measurement Range | 100 m |
| Spatial Resolution | 20 μm (10μm@50m) |
| Measurement Time | < 12 s |
| Sensitivity | -130 dB |
| RL Range | 125 dB ~ 0 dB |
| RL Dynamic Range | 80 dB |
| IL Dynamic Range | 18 dB |
| RL/IL Resolution | 0.05 dB |
| RL/IL Accuracy | ±0.1 dB |
| Dead Zone | None |
| Spectrum | |
| Wavelength Range | 1268 nm ~ 1340 nm; 1525 nm ~ 1625 nm |
| Wavelength Resolution | 0.015 pm |
| Wavelength Accuracy | ±1.0 pm |
| Group Delay Accuracy | 1.0 ps |
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