Features
- Optical coupling repeatability: <0.2dB
- Probe/probe card automatic crimping, automatic light search
- Support small beam diameter chip testing
- Optional Sensor anti-collision design, accuracy: 2μm
- Temperature range: ambient temperature ~95 ℃ (support wider range)
- Compatible with various types of wafer testing
- Optional end-to-end test solution services, including instrument selection, probe card,FA design selection, etc.
Application
CA-1000 is suitable for testing various types of active/passive components and bars. It meets various application scenarios such as mass production and R&D. With a matching instrument, it can test chip-related performance indicators such as IL, ER, RL, FSR, and responsivity